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Advanced Materials Characterization
Basic Principles, Novel Applications, and Future Directions
Language
English
English
Book
Hardback
The book covers various methods of characterization of advanced materials commonly used in engineeri...
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Libristo code: 42862496
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418 b
418 b
172.98
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The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.
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About the book
Full name
Advanced Materials Characterization
Author
Kumar, Ch Sateesh (University of Johannesburg, South Africa), Singh, M. Muralidhar (Madanapalle Institute of Technology & Science, India), Krishna, Ram (MADANAPALLE INSTITUTE OF TECHNOLOGY AND SCIENCE
Language
English
English
Binding
Book - Hardback
Date of issue
2023
Number of pages
191
EAN
9781032375106
Libristo code
42862496
Publishers
Taylor & Francis Ltd
Weight
346
Dimensions
156 x 234
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