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High Resolution X-Ray Diffractometry And Topography
Language
English
English
Book
Hardback
The application of electronic materials has created a demand for reliable techniques for examining t...
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Libristo code: 06695007
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669 b
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The application of electronic materials has created a demand for reliable techniques for examining these materials. This book looks at the area of x-ray diffraction and the modern techniques available for deployment in research. It provides the background for applying these techniques.
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About the book
Full name
High Resolution X-Ray Diffractometry And Topography
Author
B. K. Tanner
Language
English
English
Binding
Book - Hardback
Date of issue
1998
Number of pages
264
EAN
9780850667585
ISBN
9780850667585
Libristo code
06695007
Publishers
Taylor & Francis Ltd
Weight
656
Dimensions
178 x 263 x 20
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