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Materials Reliability in Microelectronics II: Volume 265
Language
English
English
Book
Paperback
The MRS Symposium Proceeding series is an internationally recognised reference suitable for research...
Libristo code: 02439156
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97 b
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The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
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About the book
Full name
Materials Reliability in Microelectronics II: Volume 265
Author
C. V. Thompson, J. R. Lloyd
Language
English
English
Binding
Book - Paperback
Date of issue
2014
Number of pages
344
EAN
9781107409682
ISBN
1107409683
Libristo code
02439156
Publishers
Cambridge University Press
Weight
46
Dimensions
152 x 229 x 18
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