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Microelectronic Test Structures for CMOS Technology
Language
English
English
Book
Hardback
Test structures are becoming more important in the development of CMOS technologies. Covering the ba...
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Libristo code: 01424507
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438 b
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Test structures are becoming more important in the development of CMOS technologies. Covering the basic concepts in test structure design for dedicated test vehicles, the book also examines high-speed characterization techniques for digital CMOS applications.
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About the book
Full name
Microelectronic Test Structures for CMOS Technology
Author
Manjul Bhushan, Mark B. Ketchen
Language
English
English
Binding
Book - Hardback
Date of issue
2011
Number of pages
373
EAN
9781441993762
ISBN
1441993762
Libristo code
01424507
Publishers
Springer-Verlag New York Inc.
Weight
776
Dimensions
155 x 235 x 27
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