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Nanometer-scale Defect Detection Using Polarized Light

Language EnglishEnglish
Book Hardback
Book Nanometer-scale Defect Detection Using Polarized Light Pierre-Richard Dahoo
Libristo code: 13595194
Publishers ISTE Ltd and John Wiley & Sons Inc, August 2016
This book describes the methods used to detect material defects at the nanoscale. The authors presen...
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This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light.

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About the book

Full name Nanometer-scale Defect Detection Using Polarized Light
Language English
Binding Book - Hardback
Date of issue 2016
Number of pages 316
EAN 9781848219366
ISBN 1848219369
Libristo code 13595194
Weight 618
Dimensions 167 x 241 x 24
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