Check order status

Become part of a community of book lovers from all over the world and get access to a whole bunch of benefits. Create an account for free

DPD courier 4.99 € GLS courier 9.99 €

Contact

How to shop

Help

My account

▸ Empty :-(

$Book Quantitative X-Ray Diffractometry Giora Kimmel$

Quantitative X-Ray Diffractometry

Name: Quantitative X-Ray Diffractometry
Brand: Springer-Verlag New York Inc.
SKU: 06624110
Price: 102.9 EUR
Availability: InStock
Author: Giora Kimmel
ISBN: 9781461395379

Giora Kimmel

Language

English

Book Paperback

$Book Quantitative X-Ray Diffractometry Giora Kimmel$

Libristo code: 06624110

Publishers Springer-Verlag New York Inc., December 2011

One of the most important techniques for determining the atomic structure of a material is X-ray dif... Full description

Libristo code: 06624110

249 b

102.90 €

In stock at our supplier Shipping in 5-8 days

Up to 30 days for returns

Customers also purchased

Las sendas de Allah : las cofradías musulmanas desde sus orígenes hasta la actualidad Alexandre Popovic

Paperback

33.86 €

Uso responsable de las redes sociales entre los adolescentes: Vera Mnguershima Akem

Paperback

39.21 €

Kudrnatá příručka Renata Stiborová

Hardback

13.03 €

Cómo convertirse en un cristiano verdadero: ?Qué significa ser salvo e ir al cielo? Charlie Avila

Paperback

10.30 €

Adelante GUIRUD

Book

25.06 €

Frauenhandel und Zwangsprostitution in Deutschland Jessica Bangisa

Paperback

16.17 €

Erfahrung und Theorie Stephan Körner

Hardback

25.47 €

Lasst sich die Todesstrafe rechtfertigen? Natalia Bokova

Paperback

16.17 €

One of the most important techniques for determining the atomic structure of a material is X-ray diffraction. One of the great problems of the technique, however, is the fact that only the intensity of the diffraction pattern can be measured, not its phase. The inverse problem, of determining the structure from the pattern thus contains ambiguities that must be resolved by other means. Quantitative X-ray analysis provides one way to resolve this phase problem: mixing the material in question with a material of known structure yields interferences that can be analyzed to yield the unknown phases. Invented in 1916, but little used at the time, the technique has seen a recent revival due to the development of extremely precise X-ray diffractometers coupled with powerful computers.