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Semiconductor Device & Failure Analysis - Using Photon Emmission Microscopy
Language
English
English
Book
Hardback
Fault detection has become increasingly difficult as integrated circuits become more and more comple...
Libristo code: 04891639
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Fault detection has become increasingly difficult as integrated circuits become more and more complex. Photon Emission Microscopy (PEM) is a physical failure analysis technique which locates and identifies faults in integrated circuits.
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About the book
Full name
Semiconductor Device & Failure Analysis - Using Photon Emmission Microscopy
Author
Wai-Kin Chim
Language
English
English
Binding
Book - Hardback
Date of issue
2000
Number of pages
288
EAN
9780471492405
ISBN
047149240X
Libristo code
04891639
Publishers
John Wiley & Sons Inc
Weight
716
Dimensions
176 x 262 x 21
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