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VLSI Design and Test
17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings
Language
English
English
Book
Paperback
This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design an...
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Libristo code: 02198670
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This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.
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About the book
Full name
VLSI Design and Test
Language
English
English
Binding
Book - Paperback
Date of issue
2013
Number of pages
388
EAN
9783642420238
ISBN
3642420230
Libristo code
02198670
Weight
6088
Dimensions
155 x 235 x 22
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