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Fringe Pattern Analysis for Optical Metrology

Language EnglishEnglish
E-book Adobe ePub DRM
E-book Fringe Pattern Analysis for Optical Metrology Manuel Servin
Libristo code: 41064112
Publishers Wiley-VCH, May 2014
The main objective of this book is to present the basic theoretical principles and practical applica... Full description
? points 387 b
158.90 €
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The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. A major novelty of this work is the presentation of a unified theoretical framework based on the Fourier description of phase shifting interferometry using the Frequency Transfer Function (FTF) along with the theory of Stochastic Process for the straightforward analysis and synthesis of phase shifting algorithms with desired properties such as spectral response, detuning and signal-to-noise robustness, harmonic rejection, etc.

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About the book

Full name Fringe Pattern Analysis for Optical Metrology
Author Manuel Servin, J. Antonio Quiroga, Moises Padilla
Language English
Binding E-book - Adobe ePub DRM
Date of issue 2014
EAN 9783527681105
Libristo code 41064112
Publishers Wiley-VCH

Categories

Mathematics & Science > Physics > Optical physics
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